JPH0447665Y2 - - Google Patents
Info
- Publication number
- JPH0447665Y2 JPH0447665Y2 JP1985171515U JP17151585U JPH0447665Y2 JP H0447665 Y2 JPH0447665 Y2 JP H0447665Y2 JP 1985171515 U JP1985171515 U JP 1985171515U JP 17151585 U JP17151585 U JP 17151585U JP H0447665 Y2 JPH0447665 Y2 JP H0447665Y2
- Authority
- JP
- Japan
- Prior art keywords
- hole plate
- support member
- cam
- adapter
- upper hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985171515U JPH0447665Y2 (en]) | 1985-11-07 | 1985-11-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985171515U JPH0447665Y2 (en]) | 1985-11-07 | 1985-11-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6279172U JPS6279172U (en]) | 1987-05-20 |
JPH0447665Y2 true JPH0447665Y2 (en]) | 1992-11-10 |
Family
ID=31107210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985171515U Expired JPH0447665Y2 (en]) | 1985-11-07 | 1985-11-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0447665Y2 (en]) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3240916C2 (de) * | 1982-11-05 | 1985-10-31 | Luther, Erich, Ing.(Grad.), 3003 Ronnenberg | Vorrichtung zum Prüfen von elektrischen Leiterplatten |
-
1985
- 1985-11-07 JP JP1985171515U patent/JPH0447665Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6279172U (en]) | 1987-05-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4896869A (en) | Moving table apparatus | |
JPH0447665Y2 (en]) | ||
JPH09129677A (ja) | 電子部品搭載装置 | |
JP2000097985A (ja) | 間隔が密な試験場所用走査試験機 | |
CN113533937A (zh) | 一种电路板测试架 | |
JP4037225B2 (ja) | Ict用接続治具 | |
JP2001051008A (ja) | 基板検査装置 | |
JPH09321099A (ja) | ウェハプローバ | |
JPH10282172A (ja) | 電子機器、並びにその電子機器の測定方法 | |
KR100676184B1 (ko) | 디스플레이 소자 테스트 장치 | |
JP4794065B2 (ja) | 被処理物の支持装置 | |
JP3418720B2 (ja) | 基板検査装置及び基板検査方法 | |
JPH01114098A (ja) | ハンダ印刷装置 | |
CN211603449U (zh) | 一种pcb板测试装置 | |
JPH05872Y2 (en]) | ||
JPH0446217Y2 (en]) | ||
JPH06300818A (ja) | フレキシブル基板検査装置 | |
JPH0148618B2 (en]) | ||
JPH083516B2 (ja) | 半導体装置用テストヘッドおよびテスト方法 | |
JP2642535B2 (ja) | ガルリード部品の試験装置 | |
JPH0719811B2 (ja) | プロ−ブ装置によるウエハの検査方法 | |
JP2004108921A (ja) | 被検査基板の検査装置 | |
JPS637477Y2 (en]) | ||
JP2796310B2 (ja) | プローブ装置 | |
JPH06258377A (ja) | プリント配線板の検査方法及び検査治具の位置合わせ装置 |